IV measurements are the first steps for device characterization. Different measurements are required to evaluate the behaviour of a transistor under DC and pulsed bias conditions. The small-signal measurements are also required using a Vector network analyzer. When a laboratory is equipped with different instruments from different vendors, the measurements need to be coherent, and the data easily sharable between the team.
How can IVCAD help you measure accuratly your transistor’s Pulsed I-V networks and Pulsed S-Parameters?
- Instruments agnostic: IVCAD allows an easy and fast Configuration of different instruments that can compose your Pulsed IV and Pulsed S-Parameter test bench. The integration of numerous drivers makes it possible to control instruments from multiple vendors. The Chronogram is also a useful tool to set all the timings for the measurements using a graphical interface compatible with any instrument used. This feature minimizes operator’s manipulation errors.
- Calibration Wizard: A simplified Calibration process, using a step-by-step wizard, unifies your tests and procedures within the lab and the company. Measurements on different benches using different instruments should not be a reason for incoherent measurement results.
- Turnkey solution: You spend too much time developing your tools internally to control your instruments and processing a large amount of data. This prevents you from concentrating on your core business which is Transistor characterization and compact model extraction. Specific modules for IV-curves in Continuous or Pulse mode as well as S-Parameters with CW or Pulsed-CW signal are developped to simplify the measurement tasks of test engineers.
- Real-time validation: Stop wasting time waiting for the end of a full test session to discover abnormal results. The live visualization helps you identify the source of errors and refine your measurement process in real-time.
- Optimized system: Combining IVCAD with AMCAD Pulsed IV AM3200 system allows you to characterize thermal and trap effects in transistors from temperature-based and time-domain-based measurements. This characterization is done by analysing the current and voltage transients using time measurements over a large acquisition period of several hundred of seconds. Use the right system for the right task!
The little extras :
- Speed: The measurement time is an important factor in the study of phenomena in a transistor. You can optimize the characterization cycle of your devices using IVCAD, thanks to the instrument drivers optimization and a robust measurement algorithm.
- Single platform for the entire team: IVCAD offers multiple modules for different characterization needs. The Visualization modules ( Basic and Advanced) help gather all the results in the same application for post-processing. All the measurements are compatible from one module to the other allowing a better team cohesion and higher productivity. the data export capabilities allow the compatibility of the measurement data obtained on your bench with commercially available CAD software.
- Single and multi setup sweep plan: Setting up an automated characterization to speed up the measurement process can be facilitated using the sweep plan.
- On-Wafer measurements: Measurement intruments are not the only controlable instruments of the transistor characterization benches. The probe station is also an important equipment in the lab. therefore, IVCAD allows a full Wafer mapping and control of semi-automatic or automatic probe stations.
- Linear Stability analysis: What is a device characterization without a basic stability analysis using S-parameters measurements. Basic Visualization module offers a comprehensive GUI to perform such analysis.
- Handy Toolbox: Don’t look outside the software to perform basic calculations, S-parameters de-embedding, TRL fixture extraction and other conversions. Toolbox is a must have module that will make your measurement experience much easier.