VIS100C-1 is a Device Modeler tool. After generating measurement data on the DUT, this module will extract a model that fit the circuit response with respect to the behavior observed for simulations perfomed in time domain. Depending on this DUT’s behavior, the modeling wizard drives the user to a well-balanced solution, where the fit versus frequency and power is optimized while lowering the model complexity to ensure a good simulation-speed and convergence. Thanks to a basic simulation, the model is then qualified through a “Test Plan” with other test signals, not used during the extraction work. These independent test signals are provided to check the physical behavior and the robustness of the model. As a function of the circuit behavior and simulation need, different models can be proposed. The following table presents some possible combinations.
|Nonlinear||Mismatch effect||In-band Memory||Low Freq. Memory||NF (noise)|
|Low Noise Amplifier||✓||✓||✓||N.Av||✓|
|High Power Amplifier||✓||✓||✓||N.Av||N.A|
N.A : Non applicable, N.Av: Non available