The BA2531 pulse controller performs the pulsed biasing of a transistor Drain in Pulsed DC or RF device Operating Life Test application.

It can operate either as an ” Efuse ” function, using constant Drain voltage while the current is pulsed by the gate bias or RF signal, or as a “one level” pulse generator, by switching alternatively the ground and the power supply voltage.

Main Features:

  • Up to 120 V, 30 A Pulse controller
  • Large current pulses even at low frequency
  • Large Storage Capacitor included
  • Located close to device under test (DUT)
  • Output voltage and current measurement sampling is synchronized to pulse trigger
  • Ultra-fast stop-in performed by a programmable over current breaker and also by a start/stop trigger

Learn More : Brochure BA2531