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  • > Post the 28 August 2015

    Visit AMCAD at EuMW 2015 in Paris

    AMCAD will be showcasing their latest solutions at the upcoming EuMW conference on September 8-10 in Paris, France. Visit our booth (#A204) to discover what’s new from AMCAD Engineering, meet our RF/microwave experts and see our live demonstrations.

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  • > Post the 26 August 2015

    AWR Connected - AMCAD

    AWR Connected™ – AMCAD provides ready access between NI AWR Design Environment™ V12 software and AMCAD Engineering stability analysis (STAN) software.

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  • > Post the 4 May 2015

    Visit AMCAD at MTT-S IMS Booth 536

    AMCAD will be showcasing their latest solutions at the upcoming IMS conference on May 17-22 in Phoenix, AZ. Visit our booth (#536) to discover what’s new from AMCAD Engineering, meet our RF/microwave experts and see our live demonstrations.

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AWR Connected - AMCAD

AWR Connected™ – AMCAD provides ready access between NI AWR Design Environment™ V12 software and AMCAD Engineering stability analysis (STAN) software.

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Pulsed IV, Pulsed S-Parameters and Compact Transistor Models

The BILT/IVCAD pulsed characterization system is the first to allow engineers and transistor designers to characterize and model GaN FETs by performing synchronized Pulsed IV and Pulsed S-Parameter measurements and developing Compact Transistor Models from the comfort of their labs.

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IVCAD Outline

IVCAD advanced measurement and modeling software addresses new challenge in modern RF and Microwave industry, at System, Circuit, or Component Levels.

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1000 Volt / 30 Amp Pulser Head

Ideal for High-Voltage Fast-Switching Transistor Characterization. The AM241 Drain probe head is intended for high voltage SiC, JFET, MOSFET, IGBT transistors pulsed measurements.

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