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  • > Post the 6 May 2014

    IMS 2014 - STAN User Group Meeting

    STAN User Group Meeting offers an informal and enlightening session and discussions about IC stability analysis. Whether you are a beginner or an expert in this field, you will find something just for you at the STAN User Group meeting, which is going to be held in Tampa Florida during IMS 2014.


  • > Post the 28 April 2014

    Microwave Journal - Executive Interview with Stephane Dellier, co-founder of AMCAD-Engineering

    Microwave Journal - Stephane Dellier, co-founder of AMCAD Engineering, talks about his company’s RF design services and the evolving role of RF test and modeling for the IC market.


  • > Post the 24 April 2014

    STAN Product Feature in Microwave Journal, April 2014

    Spurious oscillation is one of the major issues facing the designer of power amplifiers at microwave frequencies. This instability is due to the presence of feedback loops associated with high level gains even out of band.


Give your circuit a check-up with STAN !

With new design kits for Agilent ADS 2009/2011, STAN automation for AWR Microwave Office, give your circuit a check-up and save months in development using STAN tool for linear and non-linear stability analysis of your design.



Pulsed IV, Pulsed S-Parameters and Compact Transistor Models

The BILT/IVCAD pulsed characterization system is the first to allow engineers and transistor designers to characterize and model GaN FETs by performing synchronized Pulsed IV and Pulsed S-Parameter measurements and developing Compact Transistor Models from the comfort of their labs.



IVCAD Outline

IVCAD advanced measurement and modeling software addresses new challenge in modern RF and Microwave industry, at System, Circuit, or Component Levels.



1000 Volt / 30 Amp Pulser Head

Ideal for High-Voltage Fast-Switching Transistor Characterization. The AM241 Drain probe head is intended for high voltage SiC, JFET, MOSFET, IGBT transistors pulsed measurements.