> Post the 6 May 2014
STAN User Group Meeting offers an informal and enlightening session and discussions about IC stability analysis. Whether you are a beginner or an expert in this field, you will find something just for you at the STAN User Group meeting, which is going to be held in Tampa Florida during IMS 2014.
> Post the 28 April 2014
Microwave Journal - Stephane Dellier, co-founder of AMCAD Engineering, talks about his company’s RF design services and the evolving role of RF test and modeling for the IC market.
> Post the 24 April 2014
Spurious oscillation is one of the major issues facing the designer of power amplifiers at microwave frequencies. This instability is due to the presence of feedback loops associated with high level gains even out of band.
With new design kits for Agilent ADS 2009/2011, STAN automation for AWR Microwave Office, give your circuit a check-up and save months in development using STAN tool for linear and non-linear stability analysis of your design.
The BILT/IVCAD pulsed characterization system is the first to allow engineers and transistor designers to characterize and model GaN FETs by performing synchronized Pulsed IV and Pulsed S-Parameter measurements and developing Compact Transistor Models from the comfort of their labs.
IVCAD advanced measurement and modeling software addresses new challenge in modern RF and Microwave industry, at System, Circuit, or Component Levels.
Ideal for High-Voltage Fast-Switching Transistor Characterization. The AM241 Drain probe head is intended for high voltage SiC, JFET, MOSFET, IGBT transistors pulsed measurements.