Last news
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> Post the 12 April 2013
IMS 2013 - Visit AMCAD on stand #1140 in Seattle (USA)
See Demos, Learn about IVCAD, Meet STAN and More! Meet AMCAD Experts at MicroApps Presentations
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> Post the 26 October 2012
AMCAD Engineering today announced the upgrade of its PIV semiconductor device analyzer family for the next generation of High Voltage Fast Switching (HVFS) Transistors.
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> Post the 25 October 2012
EuMW 2012 - Visit AMCAD on stand #413
to discover live demos of 1kV PIV system, hybrid Load-Pull, stability analysis software, and discuss with our expert!
Give your circuit a check-up with STAN !
With new design kits for Agilent ADS 2009/2011, STAN automation for AWR Microwave Office, give your circuit a check-up and save months in development using STAN tool for linear and non-linear stability analysis of your design.
Pulsed IV, Pulsed S-Parameters and Compact Transistor Models
The BILT/IVCAD pulsed characterization system is the first to allow engineers and transistor designers to characterize and model GaN FETs by performing synchronized Pulsed IV and Pulsed S-Parameter measurements and developing Compact Transistor Models from the comfort of their labs.
Hybrid Load-Pull
This video describes VNA-based hybrid Load-Pull technique and highlights the capabilities of IVCAD to handle such measurements.
1000 Volt / 30 Amp Pulser Head
Ideal for High-Voltage Fast-Switching Transistor Characterization. The AM241 Drain probe head is intended for high voltage SiC, JFET, MOSFET, IGBT transistors pulsed measurements.
