> Post the 4 May 2015
AMCAD will be showcasing their latest solutions at the upcoming IMS conference on May 17-22 in Phoenix, AZ. Visit our booth (#536) to discover what’s new from AMCAD Engineering, meet our RF/microwave experts and see our live demonstrations.
> Post the 15 April 2015
The goal of the STAN tool University Program is to support educational institutions and academic research groups with software donations for qualified programs. By making STAN tool readily available for instruction and academic research, AMCAD is helping students to go a step further in their design projects in terms of creativity and innovation.
> Post the 7 April 2015
Maury Microwave and AMCAD Engineering announce the latest release of their MT930-series IVCAD measurement and modeling device characterization software, revision 3.5
Dr Christophe Charbonniaud discussing GaN modeling in MW&RF article
The BILT/IVCAD pulsed characterization system is the first to allow engineers and transistor designers to characterize and model GaN FETs by performing synchronized Pulsed IV and Pulsed S-Parameter measurements and developing Compact Transistor Models from the comfort of their labs.
IVCAD advanced measurement and modeling software addresses new challenge in modern RF and Microwave industry, at System, Circuit, or Component Levels.
Ideal for High-Voltage Fast-Switching Transistor Characterization. The AM241 Drain probe head is intended for high voltage SiC, JFET, MOSFET, IGBT transistors pulsed measurements.