Perform a frequency sweep on the VNA, and display the corrected S-parameters at the DUT reference plane using the live visualization tool.
Device tuning becomes easier with trace history as up to fifty (50) iterations and measurements can be displayed on the same graph. Import S2P simulation files and compare them with measurements in different display formats.
With Probe station control, measure multiple devices with one click. IQSTAR supports major automatic probe station vendors and remotely controls the wafer movement. Adding the bias conditions to the sweep plan, one can generate a large amount of data with minimum interaction with the instruments.