A Smart Load-Pull Method to Safely Reach Optimal Matching Impedances of Power Transistors, T. Reveyrand, T. Gasseling, D. Barataudet al.
, Microwave Symposium 2007 IEEE MTT-S International, June 2007, pp.1489-1492
A Novel Load-Pull Setup Allowing the Intermodulation Measurement of Power Transistors under Pulsed DC and Pulsed RF Conditions, H. Bousbia, D. Barataud, G. Neveuxet al.
, 2006 IEEE MTT-S International Microwave Symposium Digest, pp. 1452-1455, June 2006
A transistor measurement setup for microwave high power amplifiers design, J.P. Teyssier, D. Barataud, C. Charbonniaudet al.,
Asia-Pacific Conference Proceedings, vol.5, 4-7 Dec. 2005
A fully calibrated four channels time domain RF envelope measurement system for the envelope characterization of nonlinear devices in a load-pull environment, F. Macraigne, T. Reveyrand, C. Maziereet al.
, 2005 European Microwave Conference, vol.2, Oct.2005
Hot small-signal S-parameter measurements of power transistors operating under large-signal conditions in a load-pull environment for the study of nonlinear parametric interactions, T. Gasseling, D. Barataud, S. Monset al.
, IEEE Transactions on Microwave Theory and Techniques, vol. 52, Issue 3, March 2004, pp. 805-812
Time-domain pulsed large-signal non-linear characterization of microwave transistors, C. Charbonniaud, J.P. Teyssier, R. Quere, 2003 European Microwave Conference, vol. 1, 7-9 Oct. 2003
A new characterization technique of "Four hot S parameters" for the study of nonlinear parametric behaviors of microwave devices, T. Gasseling, D. Barataud, S. Monset al.
, 2003 IEEE MTT-S International Microwave Symposium Digest, vol.3, pp. 1663-1666, June 2003