> Post the 11 October 2007
Developed over a 15-year period at the XLIM laboratory (formerly IRCOM), this system has continuously been tested and improved by the research team to satisfy the most demanding of test requirements. Now brought to the state of a reliable product by the AMCAD development team, this system offers state-of-the-art features and functionalities, combined with great robustness and accuracy.
Christophe Charbonniaud, manager of the modelling team for AMCAD, said, “Performing synchronized I(V) and RF measurements in pulsed conditions with precision is a considerable challenge; nevertheless using these techniques is the only way to develop accurate models of RF semiconductor components. During the past three years AMCAD have employed this Pulsed IV/RF system for advanced modelling activities, we have successfully characterized a wide range of components on various technologies.”
Because accurate measurements are essential, this test system makes it possible for the user to visualize the true pulse shape applied to the device under test, thus avoiding characterization that may not be reliable and therefore offering a more complete understanding of the measured parameters.
“We engaged all our efforts to develop for our customers the most cost-efficient and versatile solution,” said Tony Gasseling, general manager of AMCAD, “and we offer a special thanks to the early adopters of this system.” A first new generation Pulsed IV/RF system was sold to Gal-El (MMIC) in Israel, and successfully installed during the summer.
Tamara Baksht, GaN Project Manager at Gal-El, said: “We are truly satisfied by the PIV system build for us by AMCAD Engineering. Measurements of IV in short pulses of hundreds nanoseconds are crucial for GaN technology development. The PIV system is build from standard components, that make it easily amended to everlasting changes of requirements of technology development. User-friendly software and prompt customer support make this system positively efficient.”