> Post the 12 April 2013
See Demos, Learn about IVCAD, Meet STAN and More! Meet AMCAD Experts at MicroApps Presentations
> Post the 26 October 2012
AMCAD Engineering today announced the upgrade of its PIV semiconductor device analyzer family for the next generation of High Voltage Fast Switching (HVFS) Transistors.
> Post the 25 October 2012
to discover live demos of 1kV PIV system, hybrid Load-Pull, stability analysis software, and discuss with our expert!
With new design kits for Agilent ADS 2009/2011, STAN automation for AWR Microwave Office, give your circuit a check-up and save months in development using STAN tool for linear and non-linear stability analysis of your design.
The BILT/IVCAD pulsed characterization system is the first to allow engineers and transistor designers to characterize and model GaN FETs by performing synchronized Pulsed IV and Pulsed S-Parameter measurements and developing Compact Transistor Models from the comfort of their labs.
This video describes VNA-based hybrid Load-Pull technique and highlights the capabilities of IVCAD to handle such measurements.
Ideal for High-Voltage Fast-Switching Transistor Characterization. The AM241 Drain probe head is intended for high voltage SiC, JFET, MOSFET, IGBT transistors pulsed measurements.